ActivitiesHOME > News > Activities

IEEE Conferences & Events

• Prof. HASHIZUME Masaki演講
• 發佈單位： 支會原始連結
• Date：
• Location： National Taiwan University of Science and Technology
• Content：
  

  Date:9/9~9/11共三場
  
  Outline:
  
  [Abstract]
  
  Various kinds of electronic devices are made of integrated circuits and controlled by them. If an
  
  integrated circuit does not work, a serious problem may occur. Thus, high reliability is requested for
  
  integrated circuits. Testing is a key technology to realize the high reliability. The concept and the basic
  
  test technique are introduced together with the hot topics in this lecture.
  
  [Topics]
  
  1. Defects in integrated circuits
  
  2. Fault modelling
  
  3. Tests of computer circuits
  
  4. Test vector generation
  
  5. Design for testability in computer circuits
  
  6. Electrical test approach in computer circuits
  
  7. Test vector generation for electrical testing
  
  8. Testable design for electrical tests
  
  9. Memory tests
  
  10. Analog circuit tests
  
  11. Design for testability in analog circuits
  
  12. Mixed signal circuit tests
  
  13. Assembled circuit tests
  
  14. 3D IC tests
  
   

• Sponsor： 國科會, 國立台灣科技大學
• Contact Person： 電子系邱煌仁教授
• Tel：
• Fax：
• Email： hjchiu@mail.ntust.edu.tw
• Related link：
• Related file：