Date:9/9~9/11共三場

Outline:

[Abstract]

Various kinds of electronic devices are made of integrated circuits and controlled by them. If an

integrated circuit does not work, a serious problem may occur. Thus, high reliability is requested for

integrated circuits. Testing is a key technology to realize the high reliability. The concept and the basic

test technique are introduced together with the hot topics in this lecture.

[Topics]

1. Defects in integrated circuits

2. Fault modelling

3. Tests of computer circuits

4. Test vector generation

5. Design for testability in computer circuits

6. Electrical test approach in computer circuits

7. Test vector generation for electrical testing

8. Testable design for electrical tests

9. Memory tests

10. Analog circuit tests

11. Design for testability in analog circuits

12. Mixed signal circuit tests

13. Assembled circuit tests

14. 3D IC tests