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May.01,
2015

Vol. 30
  • 2015 Second International Conference on Trustworthy Systems and their Applications (TSA)
    • The TSA 2015 conference focuses on innovative methodologies, techniques, tools, management, and applications to produce dependable and trustworthy systems and their applications in a more cost-effective way. It provides a discussion forum to bring together academic researchers, industry practitioners, and government policy and decision makers to exchange ideas and results, share experiences, and explore possible solutions to overcome current challenges.
  • 2015 IEEE 15th International Conference on Advanced Learning Technologies (ICALT)
    • It is well known that the emerging new technologies have transformed both what young people learn and how they learn today. To adapt to the new generation of learners, who are largely digital natives, how to properly apply the technologies in the learning draws increasingly attentions from researchers, practitioners, and policy makers.
  • 2015 IEEE 39th Annual Computer Software and Applications Conference Workshop (COMPSACW)
    • COMPSAC is the IEEE Signature Conference on Computers, Software, and Applications. It is one of the major international forums for academia, industry, and government to discuss research results, advancements and future trends in computer and software technologies and applications. The technical program includes keynote addresses, research papers, industrial case studies, panel discussions, fast abstracts, doctoral symposium, poster sessions, and a number of workshops on emerging important topics.
  • 2015 IEEE 39th Annual Computer Software and Applications Conference (COMPSAC)
    • COMPSAC is the IEEE Signature Conference on Computers, Software, and Applications. It is one of the major international forums for academia, industry, and government to discuss research results, advancements and future trends in computer and software technologies and applications. The technical program includes keynote addresses, research papers, industrial case studies, panel discussions, fast abstracts, doctoral symposium, poster sessions, and a number of workshops on emerging important topics.
  • 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
    • IPFA 2015 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies, which include: Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Novel CMOS Gate Stack/Dielectrics and FEOL Reliability and Failure Mechanisms Product Reliability Evaluation and Approaches Device (Ge, III-V, TFT, Memory, MEMS, LED etc.) Reliability and Failure Mechanisms Advanced Interconnects and BEOL Reliability and Failure Mechanism
  • 2015 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW)
    • The upcoming IEEE International Conference on Consumer Electronics – Taiwan, 2015 will be held from June 6th to 8th at National Taiwan University of Science and Technology. As a grand feast for scholars and professional persons all around the world, ICCE-Taiwan aims to initiate profound discussions on research and discovery in electronics and relevant professional field. After the successful debut of 2014 ICCE-Taiwan, we sincerely hope that the 2nd ICCE-Taiwan could continue its success. Furthermore, our vision is to set ICCE-Taiwan as a milestone in Consumer Electronic field and become a historic and dominant conference year by year with strong and resourceful support from the IEEE CE Society.
  • 2015 International Conference on Advanced Robotics and Intelligent Systems (ARIS)
    • ARIS 2015 is soliciting novel research results on Advanced Robotics, Intelligent Systems, and building successful Simulations for robots and systems.
  • 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)
    • The symposium aims to share recent advances in all aspects of EMC in the Asia-Pacific region, to respond the EMC requirements for all rising technologies, and to closely link up the international EMC community. The symposium will cover the entire scope of EMC; especially, it will offer a rich technical program of highest quality, lectures presented by distinguished speakers from all over the world, and a broad forum for interacting between academia and industry.
  • 2015 International Symposium on Next-Generation Electronics (ISNE)
    • The 4th ISNE conference welcomes scientific papers in the field of Computer systems and applications, Processor design, Computer networks, Electronic design automation, Multimedia systems and applications, Education in computer science and engineering, Sensor systems, Communication systems, Power electronics, Biomedical circuits and systems, Image processing, IC & IC Packaging, Photovoltaic, materials, devices and systems, Nanomaterials, Micro/Nanofabrication, Semiconductor lasers and LEDs, Photonic and optical devices, Display technology, Fiber optics and fiber sensing, Photonic communications, and Solid state lighting technology.
  • 2015 24th Wireless and Optical Communication Conference (WOCC)
    • The WOCC has become a major event for telecommunications professionals both in the U.S. and the Asia-Pacific region in the past two decades. This conference provides an excellent forum and opportunity for presenting new research results, discussing emerging technologies, innovative research ideas, and networking among telecommunications professionals. The conference theme of WOCC 2015 is "Connecting the Big Crowd: Communication Network and Big Data in the Era of Internet of Things and 5G", highlighting the convergence and integration of mobile communications, Internet, and big data processing in realizing diverse applications of Internet of Things.
  • 2015 International Carnahan Conference on Security Technology (ICCST)
    • The ICCST is an annual conference that provides a forum for exchanging information related to different aspects of security research, cloud computing, network forensics, system testing, information security, cyber and electronic security research. The ICCST will provide and support in information exchange and meeting organzation.
  • 2015 IEEE Conference on Computational Intelligence and Games (CIG)
    • Games have proven to be an ideal domain for the study of computational intelligence as not only are they fun to play and interesting to observe, but they provide competitive and dynamic environments that model many real-world problems. Additionally, methods from computational intelligence promise to have a big impact on game technology and development, assisting designers and developers and enabling new types of computer games. The Computational Intelligence and Games (CIG) conference series brings together leading researchers and practitioners from academia and industry to discuss recent advances and explore future directions in this field. The annual IEEE Conference on Computational Intelligence and Games (IEEE CIG) is one of the premier international conferences in the field of computational intelligence and games.
  • 2015 Second International Conference on Trustworthy Systems and their Applications (TSA)
    • The TSA 2015 conference focuses on innovative methodologies, techniques, tools, management, and applications to produce dependable and trustworthy systems and their applications in a more cost-effective way. It provides a discussion forum to bring together academic researchers, industry practitioners, and government policy and decision makers to exchange ideas and results, share experiences, and explore possible solutions to overcome current challenges.
  • 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
    • IPFA 2015 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies, which include: Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Novel CMOS Gate Stack/Dielectrics and FEOL Reliability and Failure Mechanisms Product Reliability Evaluation and Approaches Device (Ge, III-V, TFT, Memory, MEMS, LED etc.) Reliability and Failure Mechanisms Advanced Interconnects and BEOL Reliability and Failure Mechanism
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