| Content |
Please note the following abstract submission deadlines for 2010 I&M Society Conferences that are approaching!
IEEE International Conference on Intelligent Systems
London, UK
July 7-9, 2010
http://is.ieee-ims.org
Abstract Deadline: January 11, 2010
IEEE International Workshop on Medical Measurements and Applications
Ottawa, Canada
April 30 - May 1, 2010
http://memea.ieee-ims.org
Abstract Deadline: January 20, 2010
IEEE International Conference on Imaging Systems and Techniques
Thessaloniki, Greece
July 1-2, 2010
http://ist.ieee-ims.org
Abstract Deadline: January 25, 2010
IEEE AUTOTESTCON 2010
Orlando, FL, USA
September 13-16, 2010
http://www.autotestcon.com
Abstract Deadline: February 15, 2010
IEEE International Measurement University
Trento, Italy
July 19-24, 2010
http://imu.ieee-ims.org
Pre-Registration: NOW OPEN!
IEEE International Conference on Computational Intelligence for Measurement
Systems and Applications
Taranto, Italy
September 6-8, 2010
http://cimsa.ieee-ims.org
Abstract Deadline: April 15, 2010
IEEE International Conference on Virtual Environments, Human-Computer
Interfaces
and Measurement Systems
Taranto, Italy
September 6-8, 2010
http://vecims.ieee-ims.org
Abstract Deadline: April 15, 2010
International IEEE Symposium on Precision Clock Synchronization for Measurement,
Control, and Communication
Portsmouth, New Hampshire
September 27 - October 1, 2010
http://www.ispcs.org
Abstract Deadline: April 26, 2010
Please reference the respective web sites listed above for the complete Calls
for Papers, detailed information on submission requirements, registration
procedures, and other important information about these events. Please
distribute this information to your colleagues who may be interested in these
events. You can find all IMS technically co-sponsored events at the following
URL:
http://ieee-ims.org/main/index.php?option=com_content&view=article&id=3&Itemid=12.
|
