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  • IEEE IS&M-SC IEEE International “Sensors and Measurement” Student Contest
  • date:2017-05-04
  • 發佈單位:台北分會 原始連結
  • Dear Colleagues, Friends, and Professors,

     

    Attachment is a new initiative IEEE International student competition, this IEEE International Contest of Sensors and Measurement Systems is jointly promoted and organized by IEEE Instrumentation and Measurement Society (IMS) and IEEE Sensors Council (SC) and is sponsored by STMicroelectronics.  STMicroelectronics will provide to each team selected one SensorTileR kit plus two SensorTile “Core System” (www.st.com/sensortile), which will be the common platform to be used to develop the proposed project.

     

    Participating members of teams selected have to attend one of the live demonstration sessions that are planned in three different venues co-located with international conferences in the areas of sensors and measurement systems.

    For the IEEE International “Sensors and Measurement” Student Contest 2017-2018, three conference venues are

     

    - IEEE SENSORS Conference, Oct. 29 – Nov. 01 2017, Glasgow, UK

    - IEEE Sensor Application Symposium, March 12-14 2018, Seoul, South Korea

    - IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 12-15 2018, Houston, TX, USA

     

    Two IEEE Awards will be given to the two best Sensor and Measurement Systems applications at each one of the planned Demo Sessions, the awards of first and second prizes are USD 2500 and USD 1500 respectively, for more details please refer to the attached file.

     

    On behalf of the organizing and proposal selection committee, we sincerely invite you to organize a student team to participate this contest.  We also hope the attached ISM-contest announcement and call for participations can be distributed by your help to all your colleagues who might be interested in this competition.  If there is any question, please feel free to contact me or Prof. Salvatore Baglio (salvatore.baglio@unict.it).  Thank you.

  • Attachments:
    IEEE_ISM-Contest_-_final2.pdf